TEM-STM Serials

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Double tilt JEOL holder and single tilt ThermoFisher holder.

Basic model

Basic model of TEM-STM holder offer a nanomanipulator inside the holder. On the sample position, half TEM grid, FIB TEM grid, and 0.3mm metal wire can be installed. Double tilt holder is avilable. Holder is compatibel to JEOL, ThermoFisher, and Hitachi TEM.

A I-V unit is integrated inside the controller to provide basic I-V measurement.

 

Nanomanipulator Specification

  • - Coarse movement range: XY 2.5mm, Z 1.5mm;
  • - Fine movement range: XY 18um, Z 1.5um;
  • - Resolution of fine movement: XY 0.4nm, Z 0.04nm;
  • - Movement all controlled by software.

 

I-V measurement Specification

  • - One I-V unit included;
  • - 9 current measurement range, from 1nA to 30mA;
  • - Resolution of current measurement: better than 100fA;
  • - Voltage output range: ±10V and ±150V;
  • - Automatic I-V and I-t measurement;
  • - 3rd party SMU can be connected to holder directly.

 

Extension Modules

Several extension modules are avilable to expand the funtion of basic model.

AFM force sensor module

A self-sensing silicon AFM cantilever force sensor is installed oppersite to the nanomanipulator probe. Both compresive and tensile load can be measured. The sample usually mounted on the manipulator probe. Sensitivity of the force sensor could be down to 10nN.

 

Application example

Ge/Si core−shell nanowires have a Young’s modulus of ∼192 GPa and a tensile strength of up to 8.34 GPa. Amorphization of the Si shell can be reversible at a low strain (2%) under slow deformations, whereas the phase transformation of the Ge core is irreversible and only happens at a very high strain (34%). [Zhang, et al., Nano Lett., 2018, 18 (11), pp 7238–7246]

Optical fiber module

An optical fiber is introduced into the holder, so that sample could be illuminated or excited by light source. At the same time, the probe could be used to manipulate and to measure the sample. This hold usually is used to measure the opto-electrical response of the sample.

 

Application example

Exploration of CeO2-CuO Quantum Dots in Situ Grown on Graphene under Hypha Assistance for Highly Efficient Solar-Driven Hydrogen Production. [Qian, et al., Inorg Chem. 2018 Dec 3;57(23):14532-14541.]

Cryogenic probe module

A liquid nitrogen dewar ia attached at the end of the holder. Sampel and the nanomanipulator probe both are cool down to lower than 100K. It's used to investigate the phase transition at low temperature simutenously with electrical propterty probing.

 

Application example

Spontaneous (Anti)meron Chains in the Domain Walls of van der Waals Ferromagnetic Fe5−xGeTe2 [Gao, et al., Adv. Mater. 2020, 2005228]

The design concept of MEMS chip module on a TEM-STM holder.

A heating MEMS chip was heated up to around 700℃.

MEMS chip module

4 or 6 electrodes are provided on the sample side of the TEM-STM holder. These electrodes are used to make contact with a MEMS chip. Several different MEMS chip are avilable, for example, heating chip, electrical chip, heating and electrical chip. Beside the MEMS chip, optical fiber could be introduced simutenously.

 

Application example

In-situ imaging the electrochemical reactions of Li-CO2 nanobatteries at high temperatures in an aberration corrected environmental transmission electron microscope [Jia, et al., Nano Research volume 15, pages 542–550 (2022)]

Desktop SEM-ZEM15

ZEM15 is a desktop SEM released by ZEPTOOLS in 2019. Its acceleration voltage is 15KV. Both secondary electron detector and back scatter electron detector are equiped. EDS is an option. Resolution of ZEM15 could be better than 6nm.

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